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or forensic inspection
an integrated analyzer/Bertrand lens module provides individual flip-in/flip-out of the analyzer and Bertrand lens
Optional attachable mechanical stage
The GEM Series of professional gemological microscopes are based on Meiji Techno EM Series stereo microscope bodies
LxPOL Advanced Student or Instructor Grade Polarizing Microscope Application_Sorting or forensic inspectionThe highly streamlined Lx POL polarizing microscope delivers reliability and comfort through precision opto mechanical engineering. Tight design tolerances with the SF (strain free) optical series produce near zero optical impurity interference. Careful attention to the sub stage polarized extinction disc and individually center able objectives yield a highly controlled light path with respect to stage orientation, and ultimately a sharp contrast
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